ABIGX: Explaining Why Industrial AI Detects a Fault
Published:
How adversarial fault reconstruction and integrated gradients explain fault decisions across industrial sensors, wafer maps, and visual inspection.
Published:
How adversarial fault reconstruction and integrated gradients explain fault decisions across industrial sensors, wafer maps, and visual inspection.
Published:
How adversarial fault reconstruction and integrated gradients explain fault decisions across industrial sensors, wafer maps, and visual inspection.
Published:
How adversarial fault reconstruction and integrated gradients explain fault decisions across industrial sensors, wafer maps, and visual inspection.
Published:
How adversarial fault reconstruction and integrated gradients explain fault decisions across industrial sensors, wafer maps, and visual inspection.
Published:
IG² explains deep models by combining prediction and counterfactual gradients through an adaptive path and baseline.